Discrete die burn-in for nonpackaged die
US4899107A · kind A · utility
229Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 30, 1988 |
| Grant date | Feb 6, 1990 |
| Priority date | — |
| Expiry date | Sep 30, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture is a die cavity plate for receiving semiconductor dice, and contains cavities in which die are inserted. The second half establishes electrical contact with the dice and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical test, the die are removed from the test fixture and depositioned accordingly. The technique will allow all elements of the burn-in/test fixture to 100% reusable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.