Patent · US Expired

Process and apparatus for etching semiconductor surfaces

US4971654A · kind A · utility

31Cited by
12References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 8, 1988
Grant dateNov 20, 1990
Priority date
Expiry dateAug 8, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30604
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process and apparatus for etching semiconductor surfaces, in particular, ilicon, with a mixture containing nitrogen-oxygen based compounds as oxidizing compounds, hydrofluoric acid as the component which dissolves the oxidation product, and sulfuric acid, optionally with phosphoric acid added, as a carrier medium. This mixture makes it possible to design the process as a cyclic process in which oxygen supplied to the system ultimately effects an oxidation of the material to be etched, and the product of its oxidation is removed from the circuit. The process is noteworthy for its low usage of reagents and because it is not harmful to the environment.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.