Patent · US Expired

Bonded substrate of semiconductor elements having a high withstand voltage

US4984052A · kind A · utility

12Cited by
8References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 1989
Grant dateJan 8, 1991
Priority date
Expiry dateOct 10, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/914
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A bonded substrate comprises a first semiconductor substrate in which a plurality of semiconductor elements are formed, a second semiconductor substrate adhered to the first semiconductor substrate so as to support it by means of an insulating layer interposed therebetween, a first semi-insulating polysilicon layer interposed between the first semiconductor substrate and the insulating layer, and a second semi-insulating polysilicon layer interposed between the insulating layer and the second semiconductor substrate. The semi-insulating polysilicon layers serve to reduce the voltage applied to the insulating layer and to prevent the insulating layer from being etched.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.