Patent · US Expired

Insulated gate bipolar transistor

US4985743A · kind A · utility

13Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 19, 1988
Grant dateJan 15, 1991
Priority date
Expiry dateJul 19, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/62

Abstract

This invention is basically related to an insulated gate bipolar transistor comprising a first conductivity type semiconductor substrate, a second conductivity type semiconductor layer formed on the substrate and having a low concentration of impurities, a first conductivity type base layer formed on a surface of the semiconductor layer, a second conductivity type source layer formed on the surface of the base layer and having a channel region at at least one end thereof, a gate electrode, a source electrode and a drain electrode, and is characterized in that a voltage dropping portion is provided either inside the source layer or between the source layer and the source electrode. Accordingly an insulated gate bipolar semiconductor transistor having this configuration can prevent a latch up phenomenon caused by a voltage drop in a source layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.