Noise parameter test method and apparatus
US4998071A · kind A · utility
16Cited by
4References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 25, 1988 |
| Grant date | Mar 5, 1991 |
| Priority date | — |
| Expiry date | Oct 25, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for simultaneously measuring noise power of a two-port device under test (DUT) using a one-port tuner, a low-noise amplifier, a power divider with a plurality of outputs, and a plurality of noise meters. The noise meters are configured to measure available noise power in different frequency ranges which are closely spaced around a selected central frequency, thereby yielding the noise parameters of the DUT at the central frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.