Eric W. Strid
39Patents
17h-index
27Co-inventors
81Inventor score
Filing activity: Apr 30, 1984 → Jun 30, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4697143A | Wafer probe | Physics | 213 | Expired |
| US5565788A | Coaxial wafer probe with tip shielding | Physics | 151 | Expired |
| US4849689A | Microwave wafer probe having replaceable probe tip | Physics | 129 | Expired |
| US4827211A | Wafer probe | Physics | 128 | Expired |
| US4853627A | Wafer probes | Physics | 106 | Expired |
| US4858160A | System for setting reference reactance for vector corrected measurements | Physics | 100 | Expired |
| US4764723A | Wafer probe | Physics | 93 | Expired |
| US5561377A | System for evaluating probing networks | Physics | 68 | Expired |
| US6815963B2 | Probe for testing a device under test | Physics | 66 | Expired |
| US5659255A | Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels | Physics | 60 | Expired |
| US5869975A | System for evaluating probing networks that have multiple probing ends | Physics | 56 | Expired |
| US6608496B1 | Reference transmission line junction for probing device | Physics | 56 | Expired |
| US5973505A | System for evaluating probing networks | Physics | 54 | Expired |
| US6130544A | System for evaluating probing networks | Physics | 51 | Expired |
| US7161363B2 | Probe for testing a device under test | Physics | 39 | Expired |
| US5047725A | Verification and correction method for an error model for a measurement network | Physics | 32 | Expired |
| US7427868B2 | Active wafer probe | Physics | 30 | Expired |
| US4998071A | Noise parameter test method and apparatus | Physics | 16 | Expired |
| US7304488B2 | Shielded probe for high-frequency testing of a device under test | Physics | 15 | Active |
| US7764072B2 | Differential signal probing system | Physics | 15 | Active |
| US7321233B2 | System for evaluating probing networks | Physics | 12 | Active |
| US7759953B2 | Active wafer probe | Physics | 11 | Active |
| US7443186B2 | On-wafer test structures for differential signals | Physics | 10 | Active |
| US7482823B2 | Shielded probe for testing a device under test | Physics | 9 | Active |
| US7609077B2 | Differential signal probe with integral balun | Physics | 9 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.