Scanning tunneling microscopes with correction for coupling effects
US5066858A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 18, 1990 |
| Grant date | Nov 19, 1991 |
| Priority date | — |
| Expiry date | Apr 18, 2010 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/85
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning tunneling microscope is corrected in real time for coupling effects from the scanning electrodes or bias voltage circuit of the microscope on the tunneling current. In an automatic embodiment, a test voltage waveform is applied to the scanning electrodes or bias voltage circuit, the system determines the correction required and corrects the tunneling current signal. A method enables the operator to verify the correction. In other embodiments, predetermined values of the parameters of the coupling effects are entered by the operator; the system determines the correction required from these values and corrects the tunneling current signal with this correction; the correction is verified, and the operator enters an adjustment of the values, if the corrections did not sufficiently correct for the coupling effects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.