John A. Gurley
27Patents
24h-index
12Co-inventors
78Inventor score
Filing activity: Jun 13, 1988 → May 21, 1998
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5412980A | Tapping atomic force microscope | Emerging Cross-Sectional Technologies | 138 | Expired |
| US5266801A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 123 | Expired |
| US5519212A | Tapping atomic force microscope with phase or frequency detection | Emerging Cross-Sectional Technologies | 109 | Expired |
| US5418363A | Scanning probe microscope using stored data for vertical probe positioning | Emerging Cross-Sectional Technologies | 89 | Expired |
| US5308974A | Scanning probe microscope using stored data for vertical probe positioning | Emerging Cross-Sectional Technologies | 88 | Expired |
| US5705814A | Scanning probe microscope having automatic probe exchange and alignment | Emerging Cross-Sectional Technologies | 82 | Expired |
| US5025658A | Compact atomic force microscope | Emerging Cross-Sectional Technologies | 70 | Expired |
| US5229606A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 57 | Expired |
| US5077473A | Drift compensation for scanning probe microscopes using an enhanced probe positioning system | Emerging Cross-Sectional Technologies | 49 | Expired |
| US5051646A | Method of driving a piezoelectric scanner linearly with time | Emerging Cross-Sectional Technologies | 46 | Expired |
| US5415027A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 45 | Expired |
| USRE36488E | Tapping atomic force microscope with phase or frequency detection | General | 44 | Expired |
| US5224376A | Atomic force microscope | Emerging Cross-Sectional Technologies | 42 | Expired |
| US5204531A | Method of adjusting the size of the area scanned by a scanning probe | Emerging Cross-Sectional Technologies | 42 | Expired |
| US4871938A | Positioning device for a scanning tunneling microscope | Emerging Cross-Sectional Technologies | 40 | Expired |
| US4889988A | Feedback control for scanning tunnel microscopes | Emerging Cross-Sectional Technologies | 39 | Expired |
| US5189906A | Compact atomic force microscope | Emerging Cross-Sectional Technologies | 39 | Expired |
| US5198715A | Scanner for scanning probe microscopes having reduced Z-axis non-linearity | Emerging Cross-Sectional Technologies | 37 | Expired |
| US5066858A | Scanning tunneling microscopes with correction for coupling effects | Emerging Cross-Sectional Technologies | 35 | Expired |
| US5306919A | Positioning device for scanning probe microscopes | Emerging Cross-Sectional Technologies | 34 | Expired |
| US5898106A | Method and apparatus for obtaining improved vertical metrology measurements | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5237859A | Atomic force microscope | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5329808A | Atomic force microscope | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5253516A | Atomic force microscope for small samples having dual-mode operating capability | Emerging Cross-Sectional Technologies | 30 | Expired |
| US5314254A | Stiffness enhancer for movable stage assembly | Mechanical Engineering; Lighting; Heating | 19 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.