Digital Instruments, Inc.
41Patents
0Active
41Granted
35Portfolio score
Filing activity: Jun 13, 1988 → Jul 20, 1998
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5412980A | Tapping atomic force microscope | Emerging Cross-Sectional Technologies | 138 | Expired |
| US5266801A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 123 | Expired |
| US5519212A | Tapping atomic force microscope with phase or frequency detection | Emerging Cross-Sectional Technologies | 109 | Expired |
| US5418363A | Scanning probe microscope using stored data for vertical probe positioning | Emerging Cross-Sectional Technologies | 89 | Expired |
| US5308974A | Scanning probe microscope using stored data for vertical probe positioning | Emerging Cross-Sectional Technologies | 88 | Expired |
| US5463897A | Scanning stylus atomic force microscope with cantilever tracking and optical access | Emerging Cross-Sectional Technologies | 84 | Expired |
| US5705814A | Scanning probe microscope having automatic probe exchange and alignment | Emerging Cross-Sectional Technologies | 82 | Expired |
| US5025658A | Compact atomic force microscope | Emerging Cross-Sectional Technologies | 70 | Expired |
| US4954704A | Method to increase the speed of a scanning probe microscope | Emerging Cross-Sectional Technologies | 64 | Expired |
| US5103095A | Scanning probe microscope employing adjustable tilt and unitary head | Emerging Cross-Sectional Technologies | 63 | Expired |
| US5229606A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 57 | Expired |
| US5866807A | Method and apparatus for measuring mechanical properties on a small scale | Emerging Cross-Sectional Technologies | 56 | Expired |
| US5560244A | Scanning stylus atomic force microscope with cantilever tracking and optical access | Emerging Cross-Sectional Technologies | 52 | Expired |
| US5081390A | Method of operating a scanning probe microscope to improve drift characteristics | Emerging Cross-Sectional Technologies | 50 | Expired |
| US5077473A | Drift compensation for scanning probe microscopes using an enhanced probe positioning system | Emerging Cross-Sectional Technologies | 49 | Expired |
| US5557156A | Scan control for scanning probe microscopes | Emerging Cross-Sectional Technologies | 46 | Expired |
| US5051646A | Method of driving a piezoelectric scanner linearly with time | Emerging Cross-Sectional Technologies | 46 | Expired |
| US5415027A | Jumping probe microscope | Emerging Cross-Sectional Technologies | 45 | Expired |
| US5204531A | Method of adjusting the size of the area scanned by a scanning probe | Emerging Cross-Sectional Technologies | 42 | Expired |
| US5224376A | Atomic force microscope | Emerging Cross-Sectional Technologies | 42 | Expired |
| US4871938A | Positioning device for a scanning tunneling microscope | Emerging Cross-Sectional Technologies | 40 | Expired |
| US5189906A | Compact atomic force microscope | Emerging Cross-Sectional Technologies | 39 | Expired |
| US4889988A | Feedback control for scanning tunnel microscopes | Emerging Cross-Sectional Technologies | 39 | Expired |
| US5198715A | Scanner for scanning probe microscopes having reduced Z-axis non-linearity | Emerging Cross-Sectional Technologies | 37 | Expired |
| US5202004A | Scanning electrochemical microscopy | Emerging Cross-Sectional Technologies | 36 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.