Patent · US Expired

Multiple lamination high density interconnect process and structure employing a variable crosslinking adhesive

US5161093A · kind A · utility

157Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 2, 1990
Grant dateNov 3, 1992
Priority date
Expiry dateJul 2, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A high density interconnect structure incorporating a plurality of laminated dielectric layers is fabricated using a SPI/epoxy crosslinking copolymer blend adhesive in order to maintain the stability of the already fabricated structure during the addition of the later laminations while also maintaining the repairability of the high density interconnect structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.