Programmable/reprogrammable structure combining both antifuse and fuse elements
US5200652A · kind A · utility
93Cited by
4References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 13, 1991 |
| Grant date | Apr 6, 1993 |
| Priority date | — |
| Expiry date | Nov 13, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C17/16
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The present invention comprises a programmable structure for a integrated circuits, such as programmable read-only memory (PROM) or option selections/redundancy repair on dynamic random access memories (DRAMs), which utilizes both antifuse and fuse elements for multiple programming. Various combinations of anti-fuse and fuse elements (series or series-parallel combinations) will allow multiple programming of a given node in a particular circuit design to allow greater programming flexibility.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.