Patent · US Expired

Method for forming pitch independent contacts and a semiconductor device having the same

US5219793A · kind A · utility

137Cited by
19References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 1991
Grant dateJun 15, 1993
Priority date
Expiry dateJun 3, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/97
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A contact is formed in a semiconductor device (10), independent of underlying topography or pitch. In one method of the present invention, an insulating layer (18) is deposited over a semiconductor substrate (12). An etch stop layer (20) is deposited over the insulating layer. A frame structure (22) is formed on the etch stop material and defines at least one contact region (23 and/or 25) within which the etch stop material is exposed. The exposed portions of the etch stop material are removed from the contact region to expose a portion of the insulating layer. The exposed portion of the insulating layer is then anisotropically etched and at least one contact (30 and/or 32) is formed in the contact region. Depending on where the contact region is positioned, either a self-aligned contact or a non-self-aligned contact may be formed, or both types of contacts may be formed simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.