Projection exposure apparatus and projection exposure method
US5227862A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 1990 |
| Grant date | Jul 13, 1993 |
| Priority date | — |
| Expiry date | Dec 14, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F9/7049
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projection exposure apparatus (1) comprises an incident light optical system for causing the light emitted from a light source 1 to enter an object of exposure (4) in diagonal direction, a detection apparatus (3) for causing an interference between the light reflected from the object of exposure (4) and a reference light and detecting the resultant interference fringe, a processing circuit for determining the inclination and height of the surface of the object of exposure (4) from the optical information on the interference fringe, and a stage (7) for supporting the object of exposure (4). The object of exposure (4) is subjected to projection exposure by driving the stage (7) according to the calculated inclination and height of the object of exposure (4).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.