Patent · US Expired

High density data storage using stacked wafers

US5229647A · kind A · utility

483Cited by
8References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 21, 1992
Grant dateJul 20, 1993
Priority date
Expiry dateSep 21, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A solid-state memory unit is constructed using stacked wafers containing a large number of memory units in each wafer. Vertical connections between wafers are created using bumps at the contact points and metal in through-holes aligned with the bumps. The bumps on one wafer make contact with metal pads on a mating wafer. Mechanical bonding between the bumps and mating metal pads on another wafer is preferably avoided so that fractures due to thermal expansion differentials will be prevented. Serial addressing and data access is employed for the memory units to minimize the number of connections needed. Also, the metal pads, through-holes and bumps are formed at corners of the die and thus shared with adjacent units whenever possible, further reducing the number of vertical connections.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.