Patent · US Expired

Processing system

US5248886A · kind A · utility

24Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 27, 1992
Grant dateSep 28, 1993
Priority date
Expiry dateFeb 27, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67745
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Load lock chambers having a function of detecting positional deviation of wafers are provided in a process chamber of an ion injection apparatus, two on a carrying-in side, and two on a carrying-out side. One load lock chamber on the carrying-in side and one on the carrying-out side are used as a standby. Carrying-in carrying-out members and are outside of the process chamber. Two transfer members are in the process chamber. A dummy wafer stage is formed at a position which can be accessed by the transfer members. Wafers are transferred from load stages by the carrying-in member via the load lock chambers to the process chamber through a double operation line. Loading a wafer on the turn table and unloading a wafer therefrom can be performed simultaneously by operations of the transfer members and. The wafers are similarly carried out of the apparatus in a double operation line. At this time, dummy wafers in the process chamber can be used, if necessary.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.