Patent · US Expired

Apparatus for interlayer planarization of semiconductor material

US5257478A · kind A · utility

212Cited by
4References
9Claims
0Family size

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Key dates

Filing dateJan 31, 1992
Grant dateNov 2, 1993
Priority date
Expiry dateJan 31, 2012

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/22
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A pad for planarizing the surface of a semiconductor wafer. The pad includes at least two layers. One layer has a hydrostatic modulus which is different from the hydrostatic modulus of the other pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.