Patent · US Expired

Method of producing a wafer having a curved notch

US5279992A · kind A · utility

10Cited by
6References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 1992
Grant dateJan 18, 1994
Priority date
Expiry dateMar 25, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/978
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A wafer having chamfered bent portions in the joint regions between the contour of the wafer and the cut-away portion of the wafer such as an orientation flatness. The chipping of the wafer can be prevented, and in coating the wafer with a photoresist, forming an epitaxially grown layer on the wafer, etc., films having desired characteristics can be provided on the surface of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.