Patent · US Expired

Transistor antifuse for a programmable ROM

US5282158A · kind A · utility

63Cited by
6References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 21, 1992
Grant dateJan 25, 1994
Priority date
Expiry dateAug 21, 2012

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A programmable read-only memory device and method of fabrication are disclosed having an antifuse in the drain node of a field effect transistor. Programming is accomplished by imposing a high voltage on the transistor drain and gate which causes the antifuse to be a closed circuit; otherwise, the transistor appears as an open circuit. Locating the antifuse in the drain node as opposed to the source node avoids problems of source reverse bias.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.