Patent · US Expired

Method for predicting capacitance of connection nets on an integrated circuit

US5295088A · kind A · utility

10Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 9, 1993
Grant dateMar 15, 1994
Priority date
Expiry dateJul 9, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method estimates the interconnect capacitance of a first net in an integrated circuit. The first step of the method includes the generation of a value which indicates how tightly connected to one another are components connected to the first net. The second step of the method includes the prediction of interconnect capacitance of the first net based on the value generated in the first step and a number representing how many components are connected to the first net.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.