Focused electron-bombarded detector
US5326978A · kind A · utility
12Cited by
7References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 17, 1992 |
| Grant date | Jul 5, 1994 |
| Priority date | — |
| Expiry date | Dec 17, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A focused electron-bombarded (FEB) ion detector comprising an MCP, focusing means, and a collection anode disposed in a detector body. The collection anode includes a diode for receiving the focused output electron beam from the MCP. The gain between the input ion current to the MCP and the detector output signal from the diode is on the order of 1-100 million, depending on the device configuration and applied biasing voltages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.