Patent · US Expired

Method of fabricating BiCMOS device

US5338694A · kind A · utility

13Cited by
13References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 9, 1992
Grant dateAug 16, 1994
Priority date
Expiry dateMar 9, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/919
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A BiCMOS method and device. The BiCMOS device achieves improved performance through the use of wrap-around silicide contacts, improved MOS gate formation, the use of n- and p-type LDD's, the formation of very shallow base regions in bipolar transistors, and through separate implants for base regions of the bipolar transistors and source/drains of the MOSFETS.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.