Patent · US Expired

Method of fabricating BiCMOS device

US5338696A · kind A · utility

30Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 1, 1993
Grant dateAug 16, 1994
Priority date
Expiry dateMar 1, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/919
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A BiCMOS method and device. The BiCMOS device achieves improved performance through the use of wraparound silicide contacts, improved MOS gate formation, the use of n- and p-type LDD's, the formation of very shallow base regions in bipolar transistors, and through separate implants for base regions of the bipolar transistors and source/drains of the MOSFETS.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.