Patent · US Expired

Crystal diameter measuring device

US5378900A · kind A · utility

12Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 1993
Grant dateJan 3, 1995
Priority date
Expiry dateNov 29, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T117/1004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The growing portion of a single crystal 1 grown by the pull method is recorded and the image signal is output to a digitizing circuit 3 that converts the image signal into binary data. A memory device 4 stores the digitized images and the point P at the boundary between dark and light is detected by scanning the stored digitized images starting from the scanning-start pixel and proceeding in the direction parallel to the direction of single crystal pulling. The diameter D of the growing portion of the single crystal is determined based upon the boundary P, and the scanning-start pixel for the current operation is set at the pixel that is separated from the boundary Pb in the preceding operation by a preset number of pixels d in the opposite direction of the scan.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.