Patent · US Expired

Method of producing VDMOS transistors

US5395777A · kind A · utility

9Cited by
7References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 6, 1994
Grant dateMar 7, 1995
Priority date
Expiry dateApr 6, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/256

Abstract

A method of producing reduced-size VDMOS transistors having reduced leakage and a reduced propensity to latch-up. These advantages are attained by reducing the vertical projective area of the source electrodes of the VDMOS transistors. This is done by forming first trenches which are sufficiently deep to reach an epitaxial layer on a substrate of the VDMOS transistors before second trenches are formed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.