Patent · US Expired

Method for making aluminum single crystal interconnections on insulators

US5409862A · kind A · utility

38Cited by
8References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 1993
Grant dateApr 25, 1995
Priority date
Expiry dateMar 22, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The method of producing a semiconductor device includes the steps of forming a groove having a predetermined pattern shape on the surface of a substrate; forming a metal film on the substrate while reaction with the surface of the substrate is suppressed; and agglomerating the metal film by in-situ annealing, wherein agglomeration of the metal film is started before the metal film reacts with the surface of the substrate due to annealing, while formation of a native oxide on the metal film is suppressed, and whereby the metal film is filled into the groove by annealing at a predetermined temperature for a predetermined period of time. The structure of the semiconductor device includes an insulator in which there is formed a groove portion having a predetermined pattern shape and an electrode interconnection made of a single-crystal metal which is filled in the groove portion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.