Patent · US Expired

Method of fabrication for electro-optical devices

US5418190A · kind A · utility

38Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 1993
Grant dateMay 23, 1995
Priority date
Expiry dateDec 30, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/0202
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method of fabricating a semiconductor electro-optical device in which a cleaving apparatus is used to separate the wafer into bars of semiconductor material by striking the wafer from the epitaxial side, directly beneath the substrate side scribe mark. A series of angularly shaped trenches are etched across the epitaxial side of the semiconductor bars to permit bar separation into individual devices that allows a plurality of bars to be processed simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.