Patent · US Expired

Method for making semiconductor structures having environmentally isolated elements

US5461001A · kind A · utility

23Cited by
8References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 1994
Grant dateOct 24, 1995
Priority date
Expiry dateJun 1, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/96
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A first semiconductor wafer having a semiconductor element such as a piezoresistive element or any integrated circuit located on a top surface thereof is bonded to a second semiconductor wafer so that the semiconductor element on the first wafer is received in a cavity sealed from the outside environment. The bottom surface of the second wafer is prepared by etching it about a mask pattern so that the pattern projects from the bottom surface, thereby forming the cavity and defining projecting surfaces which are bonded to corresponding projecting areas on the first wafer to create a hermetic seal therebetween. The second wafer is electrochemically etched to produce porous silicon with regions of non-porous monocrystalline silicon extending between the top and bottom surfaces. The porous areas are thermally oxidized to convert them to silicon dioxide while the non-porous regions bonded to bond pads of the resistive pattern on the first wafer act as extended contacts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.