Vertical probe tester card with coaxial probes
US5525911A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Aug 4, 1994 |
| Grant date | Jun 11, 1996 |
| Priority date | — |
| Expiry date | Aug 4, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card is electrically connected to a tester, electrically contacted and connected to circuits to be tested, and used to transmit test signals between the tester and the circuits. It includes a plate assembly having a printed board and an earth plate insulated from each other. Probe assemblies are supported by the plate assembly and are substantially vertically contacted at their foremost ends with pads of the circuits to be tested. Each probe assembly includes a center conductor having a sharpened tip contacted with the pad of the circuit to be tested. A holder conductor shrouds the center conductor while leaving the front end portion thereof not enclosed, and having electrical continuity with the center conductor. A dielectric shrouds the holder conductor, a peripheral conductor coaxially arranged around the holder conductor with the dielectric interposed between them, and a sheath enclosing the peripheral conductor. The upper end of the holder conductor is electrically connected to a circuit on the printed board while the upper end of the peripheral conductor is electrically connected to a circuit on the earth plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.