Patent · US Expired

Insulated gate semiconductor device and method of manufacture

US5541132A · kind A · utility

32Cited by
8References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 1995
Grant dateJul 30, 1996
Priority date
Expiry dateMar 21, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/981

Abstract

An insulated gate field effect transistor (10) having an reduced gate to drain capacitance and a method of manufacturing the field effect transistor (10). A dopant well (13) is formed in a semiconductor material (11). A gate oxide layer (26) is formed on the dopant well (13) wherein the gate oxide layer (26) and a gate structure (41) having a gate contact portion (43) and a gate extension portion (44). The gate contact portion (43) permits electrical contact to the gate structure (41), whereas the gate extension portion (44) serves as the active gate portion. A portion of the gate oxide (26) adjacent the gate contact portion (43) is thickened to lower a gate to drain capacitance of the field effect transistor (10) and thereby increase a bandwidth of the insulated gate field effect transistor (10).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.