Patent · US Expired

Method for making a fine annular charge storage electrode in a semiconductor device using a phase-shift mask

US5583069A · kind A · utility

22Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 7, 1995
Grant dateDec 10, 1996
Priority date
Expiry dateJul 7, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/948

Abstract

The present invention provides a method for making a fine annular charge storage electrode in a semiconductor device, which is capable of easily forming the charge storage electrode having a double cylinder-shaped structure and a fine annular pattern which is smaller than the wavelength from the light source, using a phase-shift mask. Accordingly, the present invention has an effect in that the reliability of a memory device having the charge storage electrode is improved, by removing the bad contact in the double cylinder-shaped structure, and that the surface of the charge storage electrode can be easily increased from 20% to 80%.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.