Patent · US Expired

Microelectronic contacts with asperities and methods of making same

US5632631A · kind A · utility

175Cited by
37References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 1994
Grant dateMay 27, 1997
Priority date
Expiry dateSep 14, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49224
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Microelectronic contacts, such as flexible, tab-like, cantilever contacts, are provided with asperities disposed in a regular pattern. Each asperity has a sharp feature at its tip remote from the surface of the contact. As mating microelectronic elements are engaged with the contacts, a wiping action causes the sharp features of the asperities to scrape the mating element, so as to provide effective electrical interconnection and, optionally, effective metallurgical bonding between the contact and the mating element upon activation of a bonding material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.