Patent · US Expired

Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels

US5659255A · kind A · utility

60Cited by
8References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 26, 1996
Grant dateAug 19, 1997
Priority date
Expiry dateJun 26, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06772
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive planar probing area on the upper face of a base and a reference junction connected to the probing area by a high-frequency transmission structure. The method further includes placing the respective device-probing end of a first one of the measurement channels into contact with the planar probing area, transmitting a high-frequency signal through both the measurement channel and the reference junction and, thereafter, measuring the signal. This step is repeated for the other measurement channels and the signal conditions in the different channels are then evaluated by comparing the measured signals, where such evaluation is facilitated by maintaining, via the high-frequency transmission structure, a transmission line of substantially constant high-frequency transmission characteristic between each device-probing end coming into contact with the planar probing area and the reference junction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.