Patent · US Expired

Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool

US5663637A · kind A · utility

24Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 1996
Grant dateSep 2, 1997
Priority date
Expiry dateMar 19, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Rotary signal coupling in in-situ monitoring of a chemical-mechanical polishing process. A sensor fixed to a rotatable wafer carrier for creating a signal responsive to the chemical mechanical polishing process is coupled to a bottom half of a rotary transformer fixed to a rotating portion of the polisher. A top half of the rotary transformer, coupled to the bottom half of the rotary transformer, is fixed to a stationary portion of the polisher. The signal from the sensor is thus coupled through the rotary transformer to a process monitor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.