Arnold Halperin
20Patents
14h-index
42Co-inventors
81Inventor score
Filing activity: Apr 30, 1982 → Nov 12, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6226619A | Method and system for preventing counterfeiting of high price wholesale and retail items | Performing Operations; Transporting | 170 | Expired |
| US5559428A | In-situ monitoring of the change in thickness of films | Physics | 164 | Expired |
| US6072313A | In-situ monitoring and control of conductive films by detecting changes in induced eddy currents | Physics | 106 | Expired |
| US5660672A | In-situ monitoring of conductive films on semiconductor wafers | Physics | 96 | Expired |
| US4496900A | Nonlinearity detection using fault-generated second harmonic | Emerging Cross-Sectional Technologies | 87 | Expired |
| US5644221A | Endpoint detection for chemical mechanical polishing using frequency or amplitude mode | Physics | 82 | Expired |
| US6115616A | Hand held telephone set with separable keyboard | Electricity | 77 | Expired |
| US5731697A | In-situ monitoring of the change in thickness of films | Physics | 62 | Expired |
| US5659492A | Chemical mechanical polishing endpoint process control | Electricity | 35 | Expired |
| US5663637A | Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool | Electricity | 24 | Expired |
| US4868506A | Defect detection using intermodulation signals | Physics | 22 | Expired |
| US6242923A | Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards | Physics | 19 | Expired |
| US5770948A | Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool | Physics | 18 | Expired |
| US6141093A | Method and apparatus for locating power plane shorts using polarized light microscopy | Physics | 17 | Expired |
| US5402072A | System and method for testing and fault isolation of high density passive boards and substrates | Physics | 8 | Expired |
| US5621327A | System and method for testing and fault isolation of high density passive boards and substrates | Physics | 7 | Expired |
| US6400128B2 | Thermal modulation system and method for locating a circuit defect | Physics | 6 | Expired |
| US6337218B1 | Method to test devices on high performance ULSI wafers | Physics | 4 | Expired |
| US6236196A | Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry | Physics | 3 | Expired |
| US7808257B2 | Ionization test for electrical verification | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.