Patent · US Expired

Apparatus and method for polishing workpiece

US5670011A · kind A · utility

33Cited by
3References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 1996
Grant dateSep 23, 1997
Priority date
Expiry dateMay 2, 2016

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B57/02
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A workpiece such as a semiconductor wafer is polished to a flat mirror finish. The workpiece is held by a top ring, and a lower surface of the workpiece is polished by pressing the workpiece against an abrasive cloth mounted on a turntable while applying an abrasive solution onto the abrasive cloth. While the workpiece is being polished, an upper surface of the semiconductor wafer is prevented from being etched by supplying a neutralizer between the upper surface of the semiconductor wafer and the holding surface of the top ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.