Patent · US Expired

Method and apparatus for drying a substrate having a resist film with a miniaturized pattern

US5678116A · kind A · utility

121Cited by
4References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 4, 1995
Grant dateOct 14, 1997
Priority date
Expiry dateApr 4, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/40
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method of processing a substrate includes the steps of developing a substrate having a photo-sensitive resin film formed on its surface; washing the substrate by supplying washing liquid to the surface of the substrate, and rotating the substrate on a perpendicular axis in a horizontal plane and thereby drying the surface of the substrate, and atmosphere in which the substrate is placed is adjusted to be at a pressure lower than the atmospheric pressure in the step of drying the surface of the substrate. Instead of or in addition to this, washing liquid in which prescribed gas is dissolved may be used in the step of washing the substrate. In this case, in the step of drying the surface of the substrate, washing liquid supplied to the surface of the substrate is preferably supersaturated with gas. A substrate processing apparatus including a controller for implementing such a method is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.