Patent · US Expired

Method for detecting information stored in a MRAM cell having two magnetic layers in different thicknesses

US5703805A · kind A · utility

19Cited by
6References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 8, 1996
Grant dateDec 30, 1997
Priority date
Expiry dateMay 8, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5616
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for detecting and storing four states contained in a MRAM cell having two layers (11,13) which have different thicknesses is provided. A first magnetic field is applied to the MRAM cell, which causes a magnetoresistive change in the MRAM cell. A first and second states are detected based on the magnetoresistive change. A second magnetic field is further applied to the MRAM cell. A third and fourth states are detected based on the magnetoresistive change due to the second magnetic field.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.