Patent · US Expired

Apparatus and method for cleaning semiconductor wafers

US5733434A · kind A · utility

43Cited by
2References
14Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMay 16, 1996
Grant dateMar 31, 1998
Priority date
Expiry dateMay 16, 2016

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC02F2201/46195
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

An improvement is proposed in the cleaning treatment of semiconductor silicon wafers in which the conventional step of cleaning with an aqueous solution of an acid is replaced with a cleaning treatment with a temporarily acidic pure water which is produced electrolytically by the application of a DC voltage between an anode and a cathode bonded to the surfaces of a hydrogen-ion exchange membrane so that the acidic cleaning treatment can be performed under mild conditions so as to eliminate the troubles unavoidable in the conventional process. The apparatus used therefor comprises a rectangular vessel partitioned into a central anode compartment, in which the wafers are held in a vertical disposition within an upflow of pure water, and a pair of cathode compartments on both sides of the anode compartment by partitioning with a pair of hydrogen-ion exchange membranes, on both sides of which an anode plate and a cathode plate are bonded.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.