Method of making EEPROM cell device with polyspacer floating gate
US5789297A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 1996 |
| Grant date | Aug 4, 1998 |
| Priority date | — |
| Expiry date | Oct 24, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/6892
Abstract
A novel electrically erasable programmable read only memory (EEPROM) cell for use in semiconductor memories includes a polyspacer floating gate. The EEPROM structure also includes a select gate covering a part of the channel of the EEPROM cell, with a polysilicon spacer adjacent to the select gate. The polysilicon spacer implements a floating gate that holds charge to program the EEPROM cell. In one embodiment, a isolation layer separates the select gate and the floating gate. The isolation layer and the floating gate extends over the remaining part of the channel. A second isolation layer is formed over select gate and the floating gate. A control gate is formed on the isolation layer. Between the drain and the control gate is the second isolation layer. A lightly doped drain (LDD) structure is formed at the drain adjacent.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.