Patent · US Expired

Using floating gate devices as select gate devices for NAND flash memory and its bias scheme

US5793677A · kind A · utility

38Cited by
5References
10Claims
0Family size

Inventors

Key dates

Filing dateJun 18, 1996
Grant dateAug 11, 1998
Priority date
Expiry dateJun 18, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0483
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention facilitates programming of selected floating gate devices while successfully inhibiting the programming of unselected devices, without the need for growing multiple thicknesses of oxides. The preferred embodiment of the present invention utilizes a multiple select gate device. In particular, the select gate device is preferably a dual floating gate device rather than the conventional transistor (or device functioning as a conventional transistor) used in the current Flash memory systems as a select gate device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.