Patent · US Expired

Tunneling device

US5866935A · kind A · utility

23Cited by
17References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 25, 1996
Grant dateFeb 2, 1999
Priority date
Expiry dateNov 25, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/706
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus to analyze the aerial image of an optical system using a subwavelength slit. A slit configuration yields a higher signal-to-noise ratio than that achievable with a round aperture. The slit also allows the polarization of the aerial image to be analyzed. In an alternative embodiment a tunneling slit is used. The tunneling slit comprises an optically transparent ridge-like structure mounted to a substrate, the combined structure covered by a thin, planar metal film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.