Patent · US Expired

Method and apparatus for etching film layers on large substrates

US5895549A · kind A · utility

38Cited by
14References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 1996
Grant dateApr 20, 1999
Priority date
Expiry dateOct 16, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S414/141
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A chamber for etching substrates includes a support member therein which is suspended from a sidewall of the chamber. The support member includes multiple planar faces for receiving substrates thereon, and is rotatable about a horizontal axis to position the multiple planar faces in a horizontal position to place the substrates on the planar faces or remove the substrates from the planar faces, and a second position to place the substrates in a non-horizontal position for processing. A clamping and lifting apparatus is provided on the support member that is positionable, with respect to the support member, in an extended position to permit a substrate to be positioned between the clamping and lifting apparatus and the support member, and in a retracted position to clamp the substrate to the support member. The chamber is especially adapted to etching substrates requiring high power densities, such as substrates having aluminum films, without causing arcing. The chamber may include: insulative members disposed between the support member and the clamping and lifting apparatus, spacers disposed in the clamping and lifting apparatus for providing a gap between the clamping and lifting …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.