Patent · US Expired

Wafer bias ring in a sustained self-sputtering reactor

US5897752A · kind A · utility

99Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 20, 1997
Grant dateApr 27, 1999
Priority date
Expiry dateMay 20, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3405
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma reactor for physical vapor deposition (PVD), also known as sputtering, which is adapted so that the atomic species sputtered from the target can self-sustain the plasma without the need of a working gas such as argon. The method is particularly useful for sputtering copper. According to the invention, a bias ring arranged around the wafer and rising above it is electrically biased to control the plasma potential, and hence to control the energy and directionality of the ions being sputter deposited on the wafer. The bias ring can be either a separate biasing element which can be positioned at a selected height above the wafer or a clamping ring clamping the wafer to the pedestal but having a biasing surface electrically insulated from the wafer and the pedestal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.