Patent · US Expired

Memory cell having a plural transistor transmission gate and method of formation

US5898619A · kind A · utility

18Cited by
9References
38Claims
0Family size

Inventors

Key dates

Filing dateMay 16, 1994
Grant dateApr 27, 1999
Priority date
Expiry dateMay 16, 2014

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/903
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory circuit and method of formation uses a transmission gate (24) as a select gate. The transmission gate (24) contains a transistor (30) which is an N-channel transistor and a transistor (28) which is a P-channel transistor. The transistors (28 and 30) are electrically connected in parallel. The use of the transmission gate (24) as a select gate allows reads and writes to occur to a memory cell storage device (i.e. a capacitor (32), a floating gate (22), etc.) without a significant voltage drop occurring across the transmission gate. In addition, EEPROM technology is more compatible with EPROM/flash technology when using a transmission gate as a select gate within EEPROM devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.