Patent · US Expired

Methods for forming an intermetallic region between a solder bump and an under bump metallurgy layer and related structures

US5902686A · kind A · utility

55Cited by
18References
23Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 21, 1996
Grant dateMay 11, 1999
Priority date
Expiry dateNov 21, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/1259
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Method for forming a solder bump on a substrate include the steps of forming an under bump metallurgy layer on a substrate, forming a solder bump on the under bump metallurgy layer, and forming an intermetallic portion of the under bump metallurgy layer adjacent the solder bump. In particular, the solder bump has a predetermined shape and this predetermined shape is retained while forming the intermetallic portion of the under bump metallurgy layer. This predetermined shape preferably has a flat surface opposite the substrate thus providing a uniform thickness of solder during the formation of the intermetallic portion. Related structures are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.