Patent · US Expired

Three device BICMOS gain cell

US5909400A · kind A · utility

56Cited by
9References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 22, 1997
Grant dateJun 1, 1999
Priority date
Expiry dateAug 22, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/405
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nondestructive read, three device BICMOS gain cell for a DRAM memory having two FETs and one bipolar device. The gain cell has an improved access time (less latency), can operate for longer periods of time before a refresh operation is required, requires a smaller storage capacitance than a traditional DRAM cell, and can be produced commercially at lower costs than are presently available. In a preferred embodiment, the gain cell comprises an n channel metal oxide semiconductor field effect write transistor having its gate connected to a write word line WLw. Its drain is connected to a storage node Vs having a storage capacitance Cs associated therewith, and its source is connected to a write bit line BLw. An n channel metal oxide semiconductor field effect read transistor has its gate connected to the storage node Vs and its source connected to a read word line WLr. A PNP transistor has its base connected to the drain of the read transistor and its emitter connected to a read bit line BLr. A second embodiment is constructed with p channel FETs and an NPN transistor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.