Patent · US Expired

Methods and apparatus for polishing wafers

US5916016A · kind A · utility

75Cited by
3References
25Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 23, 1997
Grant dateJun 29, 1999
Priority date
Expiry dateOct 23, 2017

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/16
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Disclosed is a chemical mechanical polishing system. The system includes a mechanical arm and a carrier body that is configured to be coupled to the mechanical arm. The carrier body has a recessed portion for retaining a semiconductor wafer. The recessed portion has a carrier film that is in direct contact with a back side of the semiconductor wafer. The system further includes a plurality of pressure rings that are defined in the carrier body, such that the plurality of pressure rings are in direct contact with the carrier film. Each of the plurality of pressure rings are used to apply a selected pressure to the carrier film, such that the carrier film produces a back pressure against the back side of the semiconductor wafer. The back pressure is configured to be consistent with the selected pressure that is applied to each of the plurality of pressure rings. Whereby the selected pressure that is applied to each of the plurality of pressure rings controls a polishing rate in a plurality of concentric areas of the semiconductor wafer that correspond to the plurality of pressure rings.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.