Patent · US Expired

Multi-crown capacitor for high density DRAMS

US5933742A · kind A · utility

19Cited by
10References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 6, 1996
Grant dateAug 3, 1999
Priority date
Expiry dateSep 6, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/043

Abstract

A method of manufacturing multi-crown shape capacitors for use in semiconductor memories. The present invention uses the high etching selectivity between TEOS-oxide and polysilicon to fabricate the capacitor. using HSG-Si as an etching mask to etch the second dielectric layer to form dielectric pillars. An etching process is performed using the dielectric pillars as a mask to etching a portion of the first conductive layer and to etch away the remaining HSG-Si. Then side wall spacer are formed on the side walls of the dielectric pillars. Next, a selective etching process is used to define a multi-crown shape structure. Utilizing the pillars as a mold, the present invention can be used to form the multi-crown shaped structure to increase the surface area of the capacitor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.