Patent · US Expired

Graphics assisted manufacturing process for thin-film devices

US5937269A · kind A · utility

2Cited by
16References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 1997
Grant dateAug 10, 1999
Priority date
Expiry dateOct 29, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A Process for graphically assisting the partial repair of defective MCM TF wiring nets. The process comprises the steps of inserting the wiring layer of the thin-film device in a tester, scanning the wiring layer of the thin-film device with the tester, identifying defects in the wiring nets, prioritizing the defects based on a function of each of the defective wiring nets, and repairing the defects based on priority.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.