Patent · US Expired

Method for dynamic bandwidth testing

US5970052A · kind A · utility

81Cited by
4References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 1997
Grant dateOct 19, 1999
Priority date
Expiry dateSep 19, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3173
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for dynamic bandwidth testing of a link between two computer subsystems useful for determining the amount of data which can be buffered in a transmission line by delay, in which at each end of the line circuit modules are provided to couple the subsystem by a bi-directional multi-bit (BiDi) link, and providing within each said circuit module a built-in circuit and logic for dynamic transmission characterization and test of a said BiDi link between computer subsystems using built-in characterization logic macros, and during a test mode, switching said said built-in circuit and logic to test mode and using the test mode to characterize the link performance, and after the completion of characterization, the switching built-in characterization logic macros back to a normal system mode after programmatically setting timing parameters for the BiDi link to ensure safe operation of data transfer before the BiDi link is switched to system mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.